Energy Solutions for the Next Generation

TDI

Engineering & Reliability

Understanding NEBS(PDF)

TDI Engineering, Over and Above NEBS

TDI utilizes extensively equipped labs for Highly Accelerated Life Testing (HALT) and Highly Accelerated Stress Screening (HASS) to ensure real-world reliability during the design process and prior to shipment.

 
Reliability Growth (pdf)
Transistor Devices has an extensive product qualification process, including conservative design practices, Design Verification Testing (DVT), Design Validation Testing, Highly Accelerated Life Testing (HALT), and Highly Abusive Electrical Testing (HAET).
 
Highly Accelerated Life Testing (HALT)

As compared to limited bench testing and early product introduction, correct implementation of HALT during the product development cycle will reduce early failures and cost by 50 - 100% in the first 6-8 months.

Through step stress testing, HALT has the added benefits of identifying latent design flaws, as well as allowing further circuit analysis under extremes of operation.

Highly Accelerated Stress Screening (HASS)

As compared to traditional burn in, TDI's typical three hour HASS cycle is equivalent to 125 hours of static burn-in at +50 C.  HASS has the benefits of utilizing:

Continuous thermal expansion and contraction stresses to precipitate mechanical flaws such as die cracks, poor wire bonds and cold solder joints.

Dynamic output loading and input power cycling, in conjunction with high and low temperature extremes, exercise circuitry to the highest possible levels.

Real-time continuous monitoring of alarms, control lines, and sign al levels to detect failures due to momentary abnormalities, drift and tolerance buildup.

 

 

 
 
   

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